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Si570/Si571
10
Rev. 0.31
Table 8. Typical CLK± Output Phase Noise (Si570)
Offset Frequency (f)
120.00 MHz
LVDS
156.25 MHz
LVPECL
622.08 MHz
LVPECL
Units
100 Hz
1kHz
10 kHz
100 kHz
1MHz
10 MHz
100 MHz
–112
–122
–132
–137
–144
–150
n/a
–105
–122
–128
–135
–144
–147
n/a
–97
–107
–116
–121
–134
–146
–148
dBc/Hz
Table 9. Typical CLK± Output Phase Noise (Si571)
Offset Frequency
74.25 MHz
90 ppm/V
LVPECL
491.52 MHz
45 ppm/V
LVPECL
622.08 MHz
135 ppm/V
LVPECL
Units
100 Hz
1kHz
10 kHz
100 kHz
1MHz
10 MHz
100 MHz
–87
–114
–132
–142
–148
–150
n/a
–75
–100
–116
–124
–135
–146
–147
–65
–90
–109
–121
–134
–146
–147
dBc/Hz
Table 10. Absolute Maximum Ratings
Parameter
Symbol
Rating
Units
Supply Voltage
VDD
–0.5 to +3.8
Volts
Input Voltage
VI
–0.5 to VDD + 0.3
Volts
Storage Temperature
TS
–55 to +125
C
ESD Sensitivity (HBM, per JESD22-A114)
ESD
>2500
Volts
Soldering Temperature (lead-free profile)
TPEAK
260
C
Soldering Temperature Time @ TPEAK (lead-free profile)
tP
20–40
seconds
Notes:
1. Stresses beyond the absolute maximum ratings may cause permanent damage to the device. Functional operation or
specification compliance is not implied at these conditions.
2. The device is compliant with JEDEC J-STD-020C. Refer to Si5xx Packaging FAQ available for download at
www.silabs.com/VCXO for further information, including soldering profiles.
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